Addendum. Laplacian image contrast in mirror electron microscopy

Addendum. Laplacian image contrast in mirror electron microscopy

We extend the theory of Laplacian image contrast in mirror electron microscopy (MEM) to the case where the sample is illuminated by a parallel, collimated beam. This popular imaging geometry corresponds to a modern low energy electron microscope equipped with a magnetic objective lens. We show that within the constraints of the relevant approximations; the results for parallel illumination diff...

Laplacian image contrast in mirror electron microscopy

We discuss an intuitive approach to interpreting mirror electron microscopy (MEM) images, whereby image contrast is primarily caused by the Laplacian of small height or potential variations across a sample surface. This variation is blurred slightly to account for the interaction of the electrons with the electrical potential away from the surface. The method is derived from the established geo...

Droplet Epitaxy Image Contrast in Mirror Electron Microscopy

Image simulation methods are applied to interpret mirror electron microscopy (MEM) images obtained from a movie of GaAs droplet epitaxy. Cylindrical symmetry of structures grown by droplet epitaxy is assumed in the simulations which reproduce the main features of the experimental MEM image contrast, demonstrating that droplet epitaxy can be studied in real-time. It is therefore confirmed that a...

Contrast Transfer Function Correction in Electron Microscopy

The process of object reconstruction from its projections is widely used in many elds. One of the applications of reconstruction from projections is in electron microscopy. Various methods have been developed for correction of blurring that occurs when the projections are obtained by a real instrument. As the attainable resolution increases, new issues become apparent and need to be taken into ...

Z-contrast Scanning Transmission Electron Microscopy